10.1016/j.patcog.2025.112107

Journal Name
Pattern Recognition
Publication Year
2025
Authors
Zelong Liu, Yuliang Gu, Zhichao Sun, Huachao Zhu, Xin Xiao, Bo Du, Laurent Najman, Yongchao Xu
Publications Date
DOI
10.1016/j.patcog.2025.112107
Publication Source
OpenAlex
DOI URL
https://doi.org/10.1016/j.patcog.2025.112107
Locations
Upper Campus
Matched RRIDs
RRID:SCR_025139
Is Open Access
True
Cited By Count
0
Facilities
Advanced Imaging Core
Long Title
Coarse-to-fine crack cue for robust crack detection
OpenAlex ID
https://openalex.org/W4412085197
RRID Searched Term
RRID:SCR_025139