Journal Name
Publication Year
Publications Date
DOI
10.1002/aelm.202500260
Publication Source
Locations
Matched RRIDs
RRID:SCR_025139
Is Open Access
True
Cited By Count
2
Facilities
Advanced Imaging Core
Long Title
Gate‐Dielectric Surface Engineering With Fluorinated Monolayers: Minimizing Contact Resistance and Nonidealities in OFETs
OpenAlex ID
RRID Searched Term