FEI Scios™ is an ultra-high-resolution analytical DualBeam™ system that delivers outstanding 2D and 3D performance for a broad range of samples, including magnetic materials. A 110 mm stage tilts up to 90˚ and provides a long, eucentric working distance for great flexibility. FEI Scios easily accommodates a wide range of sample types and data collection techniques while simultaneously allowing maximum energy dispersive X-Ray spectroscopy (EDS) signal detection at the FIB and SEM coincidence point. TEAM™ Pegasus is a world-class materials characterization solution providing users with both elemental composition and crystal structure results in one easy-to-use EDS-EBSD package. Smart Features in the TEAM™ software streamline analysis and facilitate workflow, while optimizing data quality and helping EDAX users solve their characterization problems quickly and more efficiently.
Key Features
- Imaging Detectors: In-lens (T1, T2), CBS/ABS (Backscatter), ETD (Secondary), STEM w/ HAADF
- FIB milling with Gallium
- Platinum Deposition
- Selective Carbon Mill
- Easy-Lift Needle Manipulator for TEM lamellas
- EDX Elemental Analysis to identify which elements are present in the sample
- EBSD for grain orientation mapping
Key Applications and available processes
- TEM sample preparation
- Cross Sectioning
- EDS/EBSD analysis
- Nanofabrication/Patterning
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Equipment Fee
Characterization Service 2