PANalytical Empyrean X-Ray Diffractometer (XRD)

The Empyrean X-ray diffraction analysis system is intended for use in a wide variety of analytical X-ray diffraction applications. It is equipped with modular components which facilitate rapid configuration changes allowing many types of analysis. This system is equipped with a Co anode X-ray tube (Ƙɑ(Å)=1.79028 ), which is particularly suited to powder diffraction of sample containing significant amounts of Fe.

It is typically configured with a 3 motorized-axis Eulerian cradle stage (Phi, Chi, and Z); which is designed for high-resolution diffraction reflectometry, residual stress and texture analysis of thin films or irregularly shaped samples.

The Empyrean is equipped with a versatile PIXcel3D solid state detector which can be used in scanning or static area detector (2D) mode, scanning or static line detector (1D) mode, and receiving slit mode.

Key Features

  • Powder XRD, and Grazing Incidence XRD
  • Chi-Phi-Z motorized Eulerian Cradle stage
  • Sample specifications:
    • 140 mm maximum diameter
    • 64 mm maximum height
    • 2kg maximum mass  
  • PIXcel3D (Medipix 2) detector system

Key Applications and available processes

  • Phase identification
  • Quantitative phase analysis
  • X-ray reflectometry of thin layers and substrate materials.
  • In-plane diffraction of thin film
  • Residual stress and texture analysis
  • Micro-Diffraction

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Equipment Fee

Characterization Service 4

Radiation Safety Training prerequisit required for this equipment

Prior to training on this equipment, you must obtain a Certificate of Analytical X-Ray Training from the Radiation Safety Office.
To request this training, you may click the training link, email contact at radsafe@pitt.edu, or via phone at 412-624-2728.

After completion of the radiation safety training, please provide your certificate to the training personnel, then we can schedule equipment training.

Core Facility
Gertrude E. and John M. Petersen Institute of NanoScience and Engineering
Location
Lower Campus
Equipment Type
Materials Characterization Techniques