The Joel JEM2100F is a high resolution TEM which combines routine atomic resolution imaging of crystal lattices via coherent electron scattering or phase contrast (TEM) with incoherent electron scattering (or Z-contrast) in the scanning transmission electron microscopy (STEM) mode. It is equipped with attachments for XEDS analysis and a GIF TRIDIEM post-column energy filter for acquisition of energy-filtered images and diffraction.
Key Features
- Schottky field-emission gun (FEG) 200 kV
- ≤35° X- & Y-tilt
Resolution:
0.23 nm point to point (TEM)
0.1nm Lattice (TEM)
0.2nm (STEM)
Probe size:
0.5 (TEM mode)
0.16 nm (STEM mode)
- XEDS allows for detection from Beryllium to Uranium (atomic number Z ≥ 4)
- EELS resolution of 1.05 eV @ 200 kV, 180 µA emission current
- EELS resltuion of 0.63 eV @ 200 kV, 40 µA emission current
- Capabilities: TEM, STEM, EDS, EELS, EFTEM, EELS SI and, in situ nanoindentation with
- Hysitron picoindentor holder.
- Holders: single tilt, double tilt, and double tilt low background holder for EDS analysis,
- Hysitron H-9500 nanoindentor.
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Equipment Fee
Characterization Service 2
Core Facility
Gertrude E. and John M. Petersen Institute of NanoScience and Engineering
Location
Lower Campus
Equipment Type
Electron Microscopy