Asylum MFP3D AFM, Eberly Hall 139. Modes include contact, non-contact (AC), dual AC resonance tracking (DART), force spectroscopy, nanoindentation, nanolithography, scanning Kelvin probe, lateral force, magnetic force (MFM), and CAFM. Can be equipped with a liquids cell for imaging in fluids. Also can be equipped with a high frequency cantilever holder for piezoelectric response force microscopy.
Core Facility
Dietrich School Materials Characterization Laboratory
Location
Lower Campus
Equipment Type
Surface Science